Workshop on In-line & Real-time Metrology and Quality Control for Nano-Manufacturing

in line19 isfoe


The objective of the Workshop is the reveal the huge potentiality of in-line and real-time metrology methods (tools, measurement/analysis methodologies, protocols, integration concepts) to revolutionize the digital manufacturing of advanced materials, devices, components, processes and products based on Organic & Printed Electronics.

The Workshop topics include:

  • In-line/In-situ/Real-Time characterization tools and methodologies
  • Non-destructive metrology methods and tools
  • Novel Instruments and Improvements
  • Optical, Electrical, Structural, Visual characterization
  • Characterization protocols and standards
  • Modeling and analysis approaches
  • Integration concepts in pilot and production lines
  • Defect inspection from nano- to macro-
  • Thin film monitoring and optimization of processes
  • Feedback, Quality Control and Automation
  • In-line Process in Roll-to-Roll, Vacuum and Gas Transport
  • Manufacturing & Applications

Workshop International Organizing Committee

S. Logothetidis, Nanotechnology Lab LTFN, AUTh, Greece
N. Li Pira, Centro Ricerche FIAT, FCA Group, Italy
M. Klein, Suragus, Germany
C. Camus, Laytec, Germany
T. Burke, IBS, The Netherlands
G. Winroth, European Commission, Belgium

Organized by:

smartline logo EU H2020-SMARTLINE: "Smart In-line metrology and control for boosting the yield and quality of high-volume manufacturing of Organic electronics" (
REALNANO REALNANO: "In-line and Real-time digital nano-characterization technologies for the high yield manufacturing of Flexible Organic Electronics"

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NN is Organized by

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NN is Supported by

ECh2020 logoUCBerkeley-text-logologo U2BX1PRAXI.logoalex innov zonenanoreg logoportopalace logo

Under the Auspices of

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