Info
The objective of the Workshop is the reveal the huge potentiality of in-line and real-time metrology methods (tools, measurement/analysis methodologies, protocols, integration concepts) to revolutionize the digital manufacturing of advanced materials, devices, components, processes and products based on Organic & Printed Electronics.
The Workshop topics include:
- In-line/In-situ/Real-Time characterization tools and methodologies
- Non-destructive metrology methods and tools
- Novel Instruments and Improvements
- Optical, Electrical, Structural, Visual characterization
- Characterization protocols and standards
- Modeling and analysis approaches
- Integration concepts in pilot and production lines
- Defect inspection from nano- to macro-
- Thin film monitoring and optimization of processes
- Feedback, Quality Control and Automation
- In-line Process in Roll-to-Roll, Vacuum and Gas Transport
- Manufacturing & Applications
When
The Workshop will take place on July 2, 2019 during NANOTEXNOLOGY 2019.
Workshop International Organizing Committee
S. Logothetidis, Nanotechnology Lab LTFN, AUTh, Greece
N. Li Pira, Centro Ricerche FIAT, FCA Group, Italy
M. Klein, Suragus, Germany
C. Camus, Laytec, Germany
T. Burke, IBS, The Netherlands
G. Winroth, European Commission, Belgium
Organized by:
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EU H2020-SMARTLINE: "Smart In-line metrology and control for boosting the yield and quality of high-volume manufacturing of Organic electronics" (http://www.smartline-project.eu) |
